Authors: Zhen Chen, Yu-Tsun Shao, Steven E. Zeltmann, Harikrishnan K. P., Ethan R. Rosenberg, Caroline A. Ross, Yi Jiang, David A. Muller

Published on: July 25, 2024

Impact Score: 7.2

Arxiv code: Arxiv:2407.18063

Summary

• What is new: This research successfully demonstrates the detection and precise 3D location of individual impurity atoms within materials using multislice electron ptychography, achieving a depth resolution better than 2.7 nm.
• Why this is important: There is a significant need for methods to directly image individual impurity atoms inside materials, which is crucial for tuning their functionalities.
• What the research proposes: The researchers utilized multislice electron ptychography to detect and locate single atoms in three dimensions within complex materials.
• Results: The method resolved interstitial atoms in a garnet oxide heterostructure with deep-sub-Ångstrom lateral resolution, opening avenues for characterizing single-atom catalysts and other atomic-scale quantum systems.

Technical Details

Technological frameworks used: Multislice electron ptychography

Models used: nan

Data used: Three-dimensional atomic-scale imaging data of interstitial atoms in a garnet oxide heterostructure

Potential Impact

This innovation could significantly impact companies and markets involved in material science, semiconductor manufacturing, and quantum computing by improving the characterization and functionality of materials at the atomic scale.

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